A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies

This file was created by the Typo3 extension sevenpack version 0.7.16 --- Timezone: CET Creation date: 2023-02-08 Creation time: 01-24-07 --- Number of references 34 article A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies IEEE Transactions on Microwave Theory and Techniques 2019 8 67 8 3475-3484 10.1109/TMTT.2019.2919538 RogerLozar MatthiasOhlrogge RainerWeber NickRidler X.Shang ThorstenProbst UweArz article 6 Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz IEEE Transactions on Microwave Theory and Techniques 2019 6 67 6 2423-2432 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8693763 10.1109/TMTT.2019.2908857 UweArz KarstenKuhlmann ThorstenDziomba GerdHechtfischer Gia NgocPhung Franz JosefSchmückle WolfgangHeinrich article 8 Inﬂuence of Microwave Probes on Calibrated On-Wafer Measurements IEEE Transactions on Microwave Theory and Techniques 2019 5 67 5 1892-1900 https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf IEEE 10.1109/TMTT.2019.2903400 Gia NgocPhung Franz JosefSchmückle RalfDoerner BernhardKähne ThomasFritzsch UweArz WolfgangHeinrich conference 7 Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards 2019 3 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2019/2019_02_20_GeMiC_GNP_repository.pdf 12th German Microwave Conference 2019 10.23919/GEMIC.2019.8698163 Gia NgocPhung Franz JosefSchmückle RalfDoerner T.Fritzsch S.Schulz WolfgangHeinrich article Noise Behavior and Implementation of Interferometer Based Broadband VNA IEEE Transactions on Microwave Theory and Techniques 2019 1 67 1 249-260 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8566175 10.1109/TMTT.2018.2874667 FaisalMubarak RaffaeleRomano LucaGalatro V.Mascolo G.Rietveld MarcoSpirito article 5 High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness Advances in Radio Science 2019 17 51-57 https://www.adv-radio-sci.net/17/51/2019/ Copernicus Publications 10.5194/ars-17-51-2019 GeraldGold KonstantinLomakin KlausHelmreich UweArz conference On-wafer residual error correction through adaptive ﬁltering of veriﬁcation line measurements 2018 11 https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/CEMi18_ArzSavin_repo.pdf 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi) 978-1-5386-7845-9 10.1109/CEMI.2018.8610566 UweArz AleksandrSavin article On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors IEEE Microwave and Wireless Components Letters 2018 9 28 9 831-833 https://hal.archives-ouvertes.fr/hal-01873048 10.1109/LMWC.2018.2851386 KhadimDaffe GillesDambrine C.Durand C.Gaquière KamelHaddadi conference Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band 2018 9 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_06_04_EuMC_2018_Mode_Suppression_final_03.pdf Madrid 2018 48th European Microwave Conference (EuMC) 10.23919/EuMC.2018.8541813 Gia NgocPhung Franz JosefSchmückle RalfDoerner WolfgangHeinrich ThorstenProbst UweArz article A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model IEEE Transactions on Microwave Theory and Techniques 2018 8 66 8 3894-3900 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8385163 10.1109/TMTT.2018.2832052 ChenLiu AihuaWu ChongLi NickRidler conference Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards 2018 7 10.1109/CPEM.2018.8500810 FaisalMubarak V.Mascolo G.Rietveld MarcoSpirito KhadimDaffe KamelHaddadi conference Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy 2018 7 https://hal.archives-ouvertes.fr/hal-01913677 Nagoya, Japan 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS) 10.1109/MARSS.2018.8481160 KamelHaddadi P.Polovodov D.Theron GillesDambrine conference On the Impact of Radiation Losses in TRL Calibrations 2018 6 2018 91st ARFTG Microwave Measurement Conference (ARFTG) 10.1109/ARFTG.2018.8423820 MarcoSpirito C.De Martino LucaGalatro conference On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz 91st ARFTG Conference 2018 6 https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/arftg91_probst_final_repo.pdf 10.1109/ARFTG.2018.8423829 ThorstenProbst S.Zinal RalfDoerner UweArz conference Effects Degrading Accuracy of CPW mTRL Calibration at W Band 2018 6 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_03_07_FBH_IMS2018_final_msu.pdf Philadelphia 2018 IEEE/MTT-S International Microwave Symposium - 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