14Ind02 PlanarCal: Publications

References

	Roger Lozar, Matthias Ohlrogge, Rainer Weber, Nick Ridler, X. Shang, Thorsten Probst and Uwe Arz A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies IEEE Transactions on Microwave Theory and Techniques 67 (8), 3475-3484 (2019)
	Uwe Arz, Karsten Kuhlmann, Thorsten Dziomba, Gerd Hechtfischer, Gia Ngoc Phung, Franz Josef Schmückle and Wolfgang Heinrich Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz IEEE Transactions on Microwave Theory and Techniques 67 (6), 2423-2432 (2019)
	Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, Bernhard Kähne, Thomas Fritzsch, Uwe Arz and Wolfgang Heinrich Inﬂuence of Microwave Probes on Calibrated On-Wafer Measurements IEEE Transactions on Microwave Theory and Techniques 67 (5), 1892-1900 (2019)
	Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, T. Fritzsch, S. Schulz and Wolfgang Heinrich Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards
	Faisal Mubarak, Raffaele Romano, Luca Galatro, V. Mascolo, G. Rietveld and Marco Spirito Noise Behavior and Implementation of Interferometer Based Broadband VNA IEEE Transactions on Microwave Theory and Techniques 67 (1), 249-260 (2019)
	Gerald Gold, Konstantin Lomakin, Klaus Helmreich and Uwe Arz High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness Advances in Radio Science 17, 51-57 (2019)
	Uwe Arz and Aleksandr Savin On-wafer residual error correction through adaptive ﬁltering of veriﬁcation line measurements
	Khadim Daffe, Gilles Dambrine, C. Durand, C. Gaquière and Kamel Haddadi On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors IEEE Microwave and Wireless Components Letters 28 (9), 831-833 (2018)
	Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, Wolfgang Heinrich, Thorsten Probst and Uwe Arz Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band
	Chen Liu, Aihua Wu, Chong Li and Nick Ridler A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model IEEE Transactions on Microwave Theory and Techniques 66 (8), 3894-3900 (2018)
	Faisal Mubarak, V. Mascolo, G. Rietveld, Marco Spirito, Khadim Daffe and Kamel Haddadi Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
	Kamel Haddadi, P. Polovodov, D. Theron and Gilles Dambrine Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy
	Marco Spirito, C. De Martino and Luca Galatro On the Impact of Radiation Losses in TRL Calibrations
	Thorsten Probst, S. Zinal, Ralf Doerner and Uwe Arz On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz
	Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, Wolfgang Heinrich, Thorsten Probst and Uwe Arz Effects Degrading Accuracy of CPW mTRL Calibration at W Band
	Uwe Arz, S. Zinal, Thorsten Probst, Gerd Hechtfischer, Franz Josef Schmückle and Wolfgang Heinrich Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz
	H. Votsi, Chong Li, P. H. Aaen and Nick Ridler An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements IEEE Microwave and Wireless Components Letters 27 (11), 1034-1036 (2017)
	Thorsten Probst, Ralf Doerner, Matthias Ohlrogge, Roger Lozar and Uwe Arz 110 GHz On-Wafer Measurement Comparison on Alumina Substrate
	Nick Ridler, Roland G. Clarke and M. J. Slater 'Mind the Gap' ... Establishing Measurement Capability in the Terahertz Gap Region - from 0.1 THz to 1.1 THz
	Roland G. Clarke, Chong Li and Nick Ridler An Intra-laboratory Investigation of On-wafer Measurement Reproducibility at Millimeter-wave Frequencies
	Marco Spirito and Luca Galatro IC calibration kits and de-embedding techniques for sub-mm-wave device characterization
	Khadim Daffe, Gilles Dambrine, S. Arscott, B. Grandidier, S. Eliet, C. Boyaval, T. Xu, A. E. Fellahi, J. Marzouk and Kamel Haddadi Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization
	Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, T. Fritzsch and Wolfgang Heinrich Impact of Parasitic Coupling on Multiline TRL Calibration
	Franz Josef Schmückle, Thorsten Probst, Uwe Arz, Gia Ngoc Phung, Ralf Doerner and Wolfgang Heinrich Mutual Interference in Calibration Line Configurations
	Michael Wollensack, Johannes Hoffmann, Daniel Stalder, Juerg Ruefenacht and Markus Zeier VNA Tools II: Calibrations Involving Eigenvalue Problems
	Marco Spirito and Luca Galatro Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction IEEE Transactions on Microwave Theory and Techniques 65 (4), 9 (2017)
	Luca Galatro and Marco Spirito Fused silica based RSOL calibration substrate for improved probelevel calibration accuracy
	Chong Li, Gilles Dambrine, Kamel Haddadi, I. Roch-Jeune, H. Votsi, P. H. Aaen and Nick Ridler Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices
	Gerald Gold and Klaus Helmreich Modeling of transmission lines with multiple coated conductors
	Mark Bieler and Uwe Arz Comparison between time- and frequency-domain high-frequency device characterizations
	Khadim Daffe, Gilles Dambrine, Fabian von Kleist-Retzow and Kamel Haddadi RF wafer probing with improved contact repeatability using nanometer positioning
	Mark Bieler and Uwe Arz Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
	Luca Galatro, Faisal Mubarak and Marco Spirito On the definition of reference planes in probe-level calibrations
	Faisal Mubarak, Raffaele Romano and Marco Spirito Evaluation and Modeling of Measurement Resolution of A Vector Network Analyzer for Extreme Impedance Measurements

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Microwave measurements for planar circuits and components