A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies

This file was created by the Typo3 extension sevenpack version 0.7.16 --- Timezone: CEST Creation date: 2022-10-01 Creation time: 00-19-09 --- Number of references 34 article A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies IEEE Transactions on Microwave Theory and Techniques 2019 8 67 8 3475-3484 10.1109/TMTT.2019.2919538 RogerLozar MatthiasOhlrogge RainerWeber NickRidler X.Shang ThorstenProbst UweArz article 6 Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz IEEE Transactions on Microwave Theory and Techniques 2019 6 67 6 2423-2432 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8693763 10.1109/TMTT.2019.2908857 UweArz KarstenKuhlmann ThorstenDziomba GerdHechtfischer Gia NgocPhung Franz JosefSchmückle WolfgangHeinrich article 8 Inﬂuence of Microwave Probes on Calibrated On-Wafer Measurements IEEE Transactions on Microwave Theory and Techniques 2019 5 67 5 1892-1900 https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf IEEE 10.1109/TMTT.2019.2903400 Gia NgocPhung Franz JosefSchmückle RalfDoerner BernhardKähne ThomasFritzsch UweArz WolfgangHeinrich conference 7 Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards 2019 3 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2019/2019_02_20_GeMiC_GNP_repository.pdf 12th German Microwave Conference 2019 10.23919/GEMIC.2019.8698163 Gia NgocPhung Franz JosefSchmückle RalfDoerner T.Fritzsch S.Schulz WolfgangHeinrich article Noise Behavior and Implementation of Interferometer Based Broadband VNA IEEE Transactions on Microwave Theory and Techniques 2019 1 67 1 249-260 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8566175 10.1109/TMTT.2018.2874667 FaisalMubarak RaffaeleRomano LucaGalatro V.Mascolo G.Rietveld MarcoSpirito article 5 High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness Advances in Radio Science 2019 17 51-57 https://www.adv-radio-sci.net/17/51/2019/ Copernicus Publications 10.5194/ars-17-51-2019 GeraldGold KonstantinLomakin KlausHelmreich UweArz conference On-wafer residual error correction through adaptive ﬁltering of veriﬁcation line measurements 2018 11 https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/CEMi18_ArzSavin_repo.pdf 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi) 978-1-5386-7845-9 10.1109/CEMI.2018.8610566 UweArz AleksandrSavin article On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors IEEE Microwave and Wireless Components Letters 2018 9 28 9 831-833 https://hal.archives-ouvertes.fr/hal-01873048 10.1109/LMWC.2018.2851386 KhadimDaffe GillesDambrine C.Durand C.Gaquière KamelHaddadi conference Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band 2018 9 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_06_04_EuMC_2018_Mode_Suppression_final_03.pdf Madrid 2018 48th European Microwave Conference (EuMC) 10.23919/EuMC.2018.8541813 Gia NgocPhung Franz JosefSchmückle RalfDoerner WolfgangHeinrich ThorstenProbst UweArz article A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model IEEE Transactions on Microwave Theory and Techniques 2018 8 66 8 3894-3900 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8385163 10.1109/TMTT.2018.2832052 ChenLiu AihuaWu ChongLi NickRidler conference Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards 2018 7 10.1109/CPEM.2018.8500810 FaisalMubarak V.Mascolo G.Rietveld MarcoSpirito KhadimDaffe KamelHaddadi conference Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy 2018 7 https://hal.archives-ouvertes.fr/hal-01913677 Nagoya, Japan 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS) 10.1109/MARSS.2018.8481160 KamelHaddadi P.Polovodov D.Theron GillesDambrine conference On the Impact of Radiation Losses in TRL Calibrations 2018 6 2018 91st ARFTG Microwave Measurement Conference (ARFTG) 10.1109/ARFTG.2018.8423820 MarcoSpirito C.De Martino LucaGalatro conference On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz 91st ARFTG Conference 2018 6 https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/arftg91_probst_final_repo.pdf 10.1109/ARFTG.2018.8423829 ThorstenProbst S.Zinal RalfDoerner UweArz conference Effects Degrading Accuracy of CPW mTRL Calibration at W Band 2018 6 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_03_07_FBH_IMS2018_final_msu.pdf Philadelphia 2018 IEEE/MTT-S International Microwave Symposium - IMS 10.1109/MWSYM.2018.8439837 Gia NgocPhung Franz JosefSchmückle RalfDoerner WolfgangHeinrich ThorstenProbst UweArz conference 3 Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz 2017 12 https://oar.ptb.de/files/download/5ca47f714c93901374007754 90th ARFTG Microwave Measurement Conference (ARFTG) 2017 10.1109/ARFTG.2017.8255874 UweArz S.Zinal ThorstenProbst GerdHechtfischer Franz JosefSchmückle WolfgangHeinrich article An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements IEEE Microwave and Wireless Components Letters 2017 11 27 11 1034-1036 10.1109/LMWC.2017.2750086 H.Votsi ChongLi P. H.Aaen NickRidler conference 110 GHz On-Wafer Measurement Comparison on Alumina Substrate 2017 11 https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/arftg90_probst_repo.pdf 90th ARFTG Microwave Measurement Conference (ARFTG) 2017 10.1109/ARFTG.2017.8255867 ThorstenProbst RalfDoerner MatthiasOhlrogge RogerLozar UweArz conference 'Mind the Gap' ... Establishing Measurement Capability in the Terahertz Gap Region - from 0.1 THz to 1.1 THz 2017 11 http://eprints.whiterose.ac.uk/125335/ ARMMS RF & Microwave Society Conference NickRidler Roland G.Clarke M. J.Slater conference An Intra-laboratory Investigation of On-wafer Measurement Reproducibility at Millimeter-wave Frequencies 2017 11 http://eprints.whiterose.ac.uk/125336 90th ARFTG Microwave Measurement Conference (ARFTG) 2017 accepted 10.1109/arftg.2017.8255866 Roland G.Clarke ChongLi NickRidler conference IC calibration kits and de-embedding techniques for sub-mm-wave device characterization 2017 10 2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) 10.1109/csics.2017.8240449 MarcoSpirito LucaGalatro conference Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization 2017 10 2017 47th European Microwave Conference (EuMC) 10.23919/EuMC.2017.8230973 KhadimDaffe GillesDambrine S.Arscott B.Grandidier S.Eliet C.Boyaval T.Xu A. E.Fellahi J.Marzouk KamelHaddadi conference Impact of Parasitic Coupling on Multiline TRL Calibration 2017 10 European Microwave Conference 2017 10.23919/EuMC.2017.8230974 Gia NgocPhung Franz JosefSchmückle RalfDoerner T.Fritzsch WolfgangHeinrich conference 1 Mutual Interference in Calibration Line Configurations 2017 6 https://www.fbh-berlin.com/fileadmin/downloads/Publications/2017/2018_04_24_2017_02_15_ARFTG2017_EMPIR_PTB_submitted.pdf 89th ARFTG Microwave Measurement Conference, 2017 10.1109/ARFTG.2017.8000823 Franz JosefSchmückle ThorstenProbst UweArz Gia NgocPhung RalfDoerner WolfgangHeinrich conference VNA Tools II: Calibrations Involving Eigenvalue Problems 2017 6 https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/VnaToolsLHKMEigPaper_openaccess.pdf 89th ARFTG Microwave Measurement Conference, 2017 10.1109/ARFTG.2017.8000832 MichaelWollensack JohannesHoffmann DanielStalder JuergRuefenacht MarkusZeier article 4 Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction IEEE Transactions on Microwave Theory and Techniques 2017 4 65 4 9 10.1109/TMTT.2016.2609413 MarcoSpirito LucaGalatro conference Fused silica based RSOL calibration substrate for improved probelevel calibration accuracy 2016 12 88th ARFTG Microwave Measurement Conference, 2016 10.1109/ARFTG.2016.7839721 LucaGalatro MarcoSpirito conference Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices 2016 12 88th ARFTG Microwave Measurement Conference, 2016 10.1109/ARFTG.2016.7839719 ChongLi GillesDambrine KamelHaddadi I.Roch-Jeune H.Votsi P. H.Aaen NickRidler conference Modeling of transmission lines with multiple coated conductors 2016 10 46th European Microwave Conference, 2016 10.1109/EuMC.2016.7824423 GeraldGold KlausHelmreich conference 2016CPEM Comparison between time- and frequency-domain high-frequency device characterizations 2016 8 11 CPEM 2016, Conference on Precision Electromagnetic Measurements 10.1109/CPEM.2016.7540727 MarkBieler UweArz conference IEMN_ARFTG87th RF wafer probing with improved contact repeatability using nanometer positioning 2016 5 27 87th ARFTG Microwave Measurement Conference (ARFTG) 10.1109/ARFTG.2016.7501967 KhadimDaffe GillesDambrine Fabianvon Kleist-Retzow KamelHaddadi conference 2016SPI Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods 2016 5 9 Torino 20th IEEE Workshop on Signal and Power Integrity (SPI) 8-11 May 2016 10.1109/SaPIW.2016.7496271 1 MarkBieler UweArz conference On the definition of reference planes in probe-level calibrations 2016 5 2016 87th ARFTG Microwave Measurement Conference (ARFTG) 10.1109/ARFTG.2016.7501968 LucaGalatro FaisalMubarak MarcoSpirito conference 2015VSL Evaluation and Modeling of Measurement Resolution of A Vector Network Analyzer for Extreme Impedance Measurements 2015 12 3 86th ARFTG Microwave Measurement Conference 10.1109/ARFTG.2015.7381475 FaisalMubarak RaffaeleRomano MarcoSpirito