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--- Timezone: CET
Creation date: 2023-02-08
Creation time: 01-24-07
--- Number of references
34
article
A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies
IEEE Transactions on Microwave Theory and Techniques
2019
8
67
8
3475-3484
10.1109/TMTT.2019.2919538
RogerLozar
MatthiasOhlrogge
RainerWeber
NickRidler
X.Shang
ThorstenProbst
UweArz
article
6
Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
IEEE Transactions on Microwave Theory and Techniques
2019
6
67
6
2423-2432
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8693763
10.1109/TMTT.2019.2908857
UweArz
KarstenKuhlmann
ThorstenDziomba
GerdHechtfischer
Gia NgocPhung
Franz JosefSchmückle
WolfgangHeinrich
article
8
Influence of Microwave Probes on Calibrated On-Wafer Measurements
IEEE Transactions on Microwave Theory and Techniques
2019
5
67
5
1892-1900
https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf
IEEE
10.1109/TMTT.2019.2903400
Gia NgocPhung
Franz JosefSchmückle
RalfDoerner
BernhardKähne
ThomasFritzsch
UweArz
WolfgangHeinrich
conference
7
Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards
2019
3
https://www.fbh-berlin.com/fileadmin/downloads/Publications/2019/2019_02_20_GeMiC_GNP_repository.pdf
12th German Microwave Conference 2019
10.23919/GEMIC.2019.8698163
Gia NgocPhung
Franz JosefSchmückle
RalfDoerner
T.Fritzsch
S.Schulz
WolfgangHeinrich
article
Noise Behavior and Implementation of Interferometer Based Broadband VNA
IEEE Transactions on Microwave Theory and Techniques
2019
1
67
1
249-260
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8566175
10.1109/TMTT.2018.2874667
FaisalMubarak
RaffaeleRomano
LucaGalatro
V.Mascolo
G.Rietveld
MarcoSpirito
article
5
High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness
Advances in Radio Science
2019
17
51-57
https://www.adv-radio-sci.net/17/51/2019/
Copernicus Publications
10.5194/ars-17-51-2019
GeraldGold
KonstantinLomakin
KlausHelmreich
UweArz
conference
On-wafer residual error correction through adaptive filtering of verification line measurements
2018
11
https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/CEMi18_ArzSavin_repo.pdf
2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi)
978-1-5386-7845-9
10.1109/CEMI.2018.8610566
UweArz
AleksandrSavin
article
On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors
IEEE Microwave and Wireless Components Letters
2018
9
28
9
831-833
https://hal.archives-ouvertes.fr/hal-01873048
10.1109/LMWC.2018.2851386
KhadimDaffe
GillesDambrine
C.Durand
C.Gaquière
KamelHaddadi
conference
Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band
2018
9
https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_06_04_EuMC_2018_Mode_Suppression_final_03.pdf
Madrid
2018 48th European Microwave Conference (EuMC)
10.23919/EuMC.2018.8541813
Gia NgocPhung
Franz JosefSchmückle
RalfDoerner
WolfgangHeinrich
ThorstenProbst
UweArz
article
A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model
IEEE Transactions on Microwave Theory and Techniques
2018
8
66
8
3894-3900
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8385163
10.1109/TMTT.2018.2832052
ChenLiu
AihuaWu
ChongLi
NickRidler
conference
Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
2018
7
10.1109/CPEM.2018.8500810
FaisalMubarak
V.Mascolo
G.Rietveld
MarcoSpirito
KhadimDaffe
KamelHaddadi
conference
Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy
2018
7
https://hal.archives-ouvertes.fr/hal-01913677
Nagoya, Japan
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)
10.1109/MARSS.2018.8481160
KamelHaddadi
P.Polovodov
D.Theron
GillesDambrine
conference
On the Impact of Radiation Losses in TRL Calibrations
2018
6
2018 91st ARFTG Microwave Measurement Conference (ARFTG)
10.1109/ARFTG.2018.8423820
MarcoSpirito
C.De Martino
LucaGalatro
conference
On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz
91st ARFTG Conference
2018
6
https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/arftg91_probst_final_repo.pdf
10.1109/ARFTG.2018.8423829
ThorstenProbst
S.Zinal
RalfDoerner
UweArz
conference
Effects Degrading Accuracy of CPW mTRL Calibration at W Band
2018
6
https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_03_07_FBH_IMS2018_final_msu.pdf
Philadelphia
2018 IEEE/MTT-S International Microwave Symposium - IMS
10.1109/MWSYM.2018.8439837
Gia NgocPhung
Franz JosefSchmückle
RalfDoerner
WolfgangHeinrich
ThorstenProbst
UweArz
conference
3
Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz
2017
12
https://oar.ptb.de/files/download/5ca47f714c93901374007754
90th ARFTG Microwave Measurement Conference (ARFTG) 2017
10.1109/ARFTG.2017.8255874
UweArz
S.Zinal
ThorstenProbst
GerdHechtfischer
Franz JosefSchmückle
WolfgangHeinrich
article
An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements
IEEE Microwave and Wireless Components Letters
2017
11
27
11
1034-1036
10.1109/LMWC.2017.2750086
H.Votsi
ChongLi
P. H.Aaen
NickRidler
conference
110 GHz On-Wafer Measurement Comparison on Alumina Substrate
2017
11
https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/arftg90_probst_repo.pdf
90th ARFTG Microwave Measurement Conference (ARFTG) 2017
10.1109/ARFTG.2017.8255867
ThorstenProbst
RalfDoerner
MatthiasOhlrogge
RogerLozar
UweArz
conference
'Mind the Gap' ... Establishing Measurement Capability in the Terahertz Gap Region - from 0.1 THz to 1.1 THz
2017
11
http://eprints.whiterose.ac.uk/125335/
ARMMS RF & Microwave Society Conference
NickRidler
Roland G.Clarke
M. J.Slater
conference
An Intra-laboratory Investigation of On-wafer Measurement Reproducibility at Millimeter-wave Frequencies
2017
11
http://eprints.whiterose.ac.uk/125336
90th ARFTG Microwave Measurement Conference (ARFTG) 2017
accepted
10.1109/arftg.2017.8255866
Roland G.Clarke
ChongLi
NickRidler
conference
IC calibration kits and de-embedding techniques for sub-mm-wave device characterization
2017
10
2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
10.1109/csics.2017.8240449
MarcoSpirito
LucaGalatro
conference
Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization
2017
10
2017 47th European Microwave Conference (EuMC)
10.23919/EuMC.2017.8230973
KhadimDaffe
GillesDambrine
S.Arscott
B.Grandidier
S.Eliet
C.Boyaval
T.Xu
A. E.Fellahi
J.Marzouk
KamelHaddadi
conference
Impact of Parasitic Coupling on Multiline TRL Calibration
2017
10
European Microwave Conference 2017
10.23919/EuMC.2017.8230974
Gia NgocPhung
Franz JosefSchmückle
RalfDoerner
T.Fritzsch
WolfgangHeinrich
conference
1
Mutual Interference in Calibration Line Configurations
2017
6
https://www.fbh-berlin.com/fileadmin/downloads/Publications/2017/2018_04_24_2017_02_15_ARFTG2017_EMPIR_PTB_submitted.pdf
89th ARFTG Microwave Measurement Conference, 2017
10.1109/ARFTG.2017.8000823
Franz JosefSchmückle
ThorstenProbst
UweArz
Gia NgocPhung
RalfDoerner
WolfgangHeinrich
conference
VNA Tools II: Calibrations Involving Eigenvalue Problems
2017
6
https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/VnaToolsLHKMEigPaper_openaccess.pdf
89th ARFTG Microwave Measurement Conference, 2017
10.1109/ARFTG.2017.8000832
MichaelWollensack
JohannesHoffmann
DanielStalder
JuergRuefenacht
MarkusZeier
article
4
Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction
IEEE Transactions on Microwave Theory and Techniques
2017
4
65
4
9
10.1109/TMTT.2016.2609413
MarcoSpirito
LucaGalatro
conference
Fused silica based RSOL calibration substrate for improved probelevel calibration accuracy
2016
12
88th ARFTG Microwave Measurement Conference, 2016
10.1109/ARFTG.2016.7839721
LucaGalatro
MarcoSpirito
conference
Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices
2016
12
88th ARFTG Microwave Measurement Conference, 2016
10.1109/ARFTG.2016.7839719
ChongLi
GillesDambrine
KamelHaddadi
I.Roch-Jeune
H.Votsi
P. H.Aaen
NickRidler
conference
Modeling of transmission lines with multiple coated conductors
2016
10
46th European Microwave Conference, 2016
10.1109/EuMC.2016.7824423
GeraldGold
KlausHelmreich
conference
2016CPEM
Comparison between time- and frequency-domain high-frequency device characterizations
2016
8
11
CPEM 2016, Conference on Precision Electromagnetic Measurements
10.1109/CPEM.2016.7540727
MarkBieler
UweArz
conference
IEMN_ARFTG87th
RF wafer probing with improved contact repeatability using nanometer positioning
2016
5
27
87th ARFTG Microwave Measurement Conference (ARFTG)
10.1109/ARFTG.2016.7501967
KhadimDaffe
GillesDambrine
Fabianvon Kleist-Retzow
KamelHaddadi
conference
2016SPI
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
2016
5
9
Torino
20th IEEE Workshop on Signal and Power Integrity (SPI)
8-11 May 2016
10.1109/SaPIW.2016.7496271
1
MarkBieler
UweArz
conference
On the definition of reference planes in probe-level calibrations
2016
5
2016 87th ARFTG Microwave Measurement Conference (ARFTG)
10.1109/ARFTG.2016.7501968
LucaGalatro
FaisalMubarak
MarcoSpirito
conference
2015VSL
Evaluation and Modeling of Measurement Resolution of A Vector Network Analyzer for Extreme Impedance Measurements
2015
12
3
86th ARFTG Microwave Measurement Conference
10.1109/ARFTG.2015.7381475
FaisalMubarak
RaffaeleRomano
MarcoSpirito