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Influence of Microwave Probes on Calibrated On-Wafer Measurements

Author(s): Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, Bernhard Kähne, Thomas Fritzsch, Uwe Arz and Wolfgang Heinrich
Journal: IEEE Transactions on Microwave Theory and Techniques
Year: 2019
Month: May
Volume: 67
Issue: 5
Pages: 1892-1900
Publisher: IEEE
DOI: 10.1109/TMTT.2019.2903400
Web URL:

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