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Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices

Author(s): Chong Li, Gilles Dambrine, Kamel Haddadi, I. Roch-Jeune, H. Votsi, P. H. Aaen and Nick Ridler
Year: 2016
Month: December
Conference name: 88th ARFTG Microwave Measurement Conference, 2016
DOI: 10.1109/ARFTG.2016.7839719

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