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Roger Lozar, Matthias Ohlrogge, Rainer Weber, Nick Ridler, X. Shang, Thorsten Probst and Uwe Arz
A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies
IEEE Transactions on Microwave Theory and Techniques 67 (8), 3475-3484 (2019)
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Uwe Arz, Karsten Kuhlmann, Thorsten Dziomba, Gerd Hechtfischer, Gia Ngoc Phung, Franz Josef Schmückle and Wolfgang Heinrich
Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
IEEE Transactions on Microwave Theory and Techniques 67 (6), 2423-2432 (2019)
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Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, Bernhard Kähne, Thomas Fritzsch, Uwe Arz and Wolfgang Heinrich
Influence of Microwave Probes on Calibrated On-Wafer Measurements
IEEE Transactions on Microwave Theory and Techniques 67 (5), 1892-1900 (2019)
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Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, T. Fritzsch, S. Schulz and Wolfgang Heinrich
Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards
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Faisal Mubarak, Raffaele Romano, Luca Galatro, V. Mascolo, G. Rietveld and Marco Spirito
Noise Behavior and Implementation of Interferometer Based Broadband VNA
IEEE Transactions on Microwave Theory and Techniques 67 (1), 249-260 (2019)
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Gerald Gold, Konstantin Lomakin, Klaus Helmreich and Uwe Arz
High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness
Advances in Radio Science 17, 51-57 (2019)
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Uwe Arz and Aleksandr Savin
On-wafer residual error correction through adaptive filtering of verification line measurements
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Khadim Daffe, Gilles Dambrine, C. Durand, C. Gaquière and Kamel Haddadi
On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors
IEEE Microwave and Wireless Components Letters 28 (9), 831-833 (2018)
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Gia Ngoc Phung, Franz Josef Schmückle, Ralf Doerner, Wolfgang Heinrich, Thorsten Probst and Uwe Arz
Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band
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Chen Liu, Aihua Wu, Chong Li and Nick Ridler
A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model
IEEE Transactions on Microwave Theory and Techniques 66 (8), 3894-3900 (2018)
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Faisal Mubarak, V. Mascolo, G. Rietveld, Marco Spirito, Khadim Daffe and Kamel Haddadi
Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
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Kamel Haddadi, P. Polovodov, D. Theron and Gilles Dambrine
Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy
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