% % This file was created by the Typo3 extension % sevenpack version 0.7.16 % % --- Timezone: CET % Creation date: 2023-02-08 % Creation time: 02-06-35 % --- Number of references % 34 % @Article { , title = {A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies}, journal = {IEEE Transactions on Microwave Theory and Techniques}, year = {2019}, month = {8}, volume = {67}, number = {8}, pages = {3475-3484}, DOI = {10.1109/TMTT.2019.2919538}, author = {Lozar, Roger and Ohlrogge, Matthias and Weber, Rainer and Ridler, Nick and Shang, X. and Probst, Thorsten and Arz, Uwe} } @Article { 6, title = {Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz}, journal = {IEEE Transactions on Microwave Theory and Techniques}, year = {2019}, month = {6}, volume = {67}, number = {6}, pages = {2423-2432}, web_url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=8693763}, DOI = {10.1109/TMTT.2019.2908857}, author = {Arz, Uwe and Kuhlmann, Karsten and Dziomba, Thorsten and Hechtfischer, Gerd and Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Heinrich, Wolfgang} } @Article { 8, title = {Influence of Microwave Probes on Calibrated On-Wafer Measurements}, journal = {IEEE Transactions on Microwave Theory and Techniques}, year = {2019}, month = {5}, volume = {67}, number = {5}, pages = {1892-1900}, web_url = {https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf}, publisher = {IEEE}, DOI = {10.1109/TMTT.2019.2903400}, author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and K{\"a}hne, Bernhard and Fritzsch, Thomas and Arz, Uwe and Heinrich, Wolfgang} } @Conference { 7, title = {Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards}, year = {2019}, month = {3}, web_url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2019/2019_02_20_GeMiC_GNP_repository.pdf}, event_name = {12th German Microwave Conference 2019}, DOI = {10.23919/GEMIC.2019.8698163}, author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Fritzsch, T. and Schulz, S. and Heinrich, Wolfgang} } @Article { , title = {Noise Behavior and Implementation of Interferometer Based Broadband VNA}, journal = {IEEE Transactions on Microwave Theory and Techniques}, year = {2019}, month = {1}, volume = {67}, number = {1}, pages = {249-260}, web_url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=8566175}, DOI = {10.1109/TMTT.2018.2874667}, author = {Mubarak, Faisal and Romano, Raffaele and Galatro, Luca and Mascolo, V. and Rietveld, G. and Spirito, Marco} } @Article { 5, title = {High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness}, journal = {Advances in Radio Science}, year = {2019}, volume = {17}, pages = {51-57}, web_url = {https://www.adv-radio-sci.net/17/51/2019/}, publisher = {Copernicus Publications}, DOI = {10.5194/ars-17-51-2019}, author = {Gold, Gerald and Lomakin, Konstantin and Helmreich, Klaus and Arz, Uwe} } @Conference { , title = {On-wafer residual error correction through adaptive filtering of verification line measurements}, year = {2018}, month = {11}, url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/CEMi18_ArzSavin_repo.pdf}, event_name = {2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi)}, ISBN = {978-1-5386-7845-9}, DOI = {10.1109/CEMI.2018.8610566}, author = {Arz, Uwe and Savin, Aleksandr} } @Article { , title = {On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors}, journal = {IEEE Microwave and Wireless Components Letters}, year = {2018}, month = {9}, volume = {28}, number = {9}, pages = {831-833}, url = {https://hal.archives-ouvertes.fr/hal-01873048}, DOI = {10.1109/LMWC.2018.2851386}, author = {Daffe, Khadim and Dambrine, Gilles and Durand, C. and Gaqui{\`e}re, C. and Haddadi, Kamel} } @Conference { , title = {Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band}, year = {2018}, month = {9}, url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_06_04_EuMC_2018_Mode_Suppression_final_03.pdf}, event_place = {Madrid}, event_name = {2018 48th European Microwave Conference (EuMC)}, DOI = {10.23919/EuMC.2018.8541813}, author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Heinrich, Wolfgang and Probst, Thorsten and Arz, Uwe} } @Article { , title = {A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model}, journal = {IEEE Transactions on Microwave Theory and Techniques}, year = {2018}, month = {8}, volume = {66}, number = {8}, pages = {3894-3900}, url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=8385163}, DOI = {10.1109/TMTT.2018.2832052}, author = {Liu, Chen and Wu, Aihua and Li, Chong and Ridler, Nick} } @Conference { , title = {Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards}, year = {2018}, month = {7}, DOI = {10.1109/CPEM.2018.8500810}, author = {Mubarak, Faisal and Mascolo, V. and Rietveld, G. and Spirito, Marco and Daffe, Khadim and Haddadi, Kamel} } @Conference { , title = {Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy}, year = {2018}, month = {7}, url = {https://hal.archives-ouvertes.fr/hal-01913677}, event_place = {Nagoya, Japan}, event_name = {2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)}, DOI = {10.1109/MARSS.2018.8481160}, author = {Haddadi, Kamel and Polovodov, P. and Theron, D. and Dambrine, Gilles} } @Conference { , title = {On the Impact of Radiation Losses in TRL Calibrations}, year = {2018}, month = {6}, event_name = {2018 91st ARFTG Microwave Measurement Conference (ARFTG)}, DOI = {10.1109/ARFTG.2018.8423820}, author = {Spirito, Marco and De Martino, C. and Galatro, Luca} } @Conference { , title = {On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz}, journal = {91st ARFTG Conference}, year = {2018}, month = {6}, web_url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/arftg91_probst_final_repo.pdf}, DOI = {10.1109/ARFTG.2018.8423829}, author = {Probst, Thorsten and Zinal, S. and Doerner, Ralf and Arz, Uwe} } @Conference { , title = {Effects Degrading Accuracy of CPW mTRL Calibration at W Band}, year = {2018}, month = {6}, url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_03_07_FBH_IMS2018_final_msu.pdf}, event_place = {Philadelphia}, event_name = {2018 IEEE/MTT-S International Microwave Symposium - IMS}, DOI = {10.1109/MWSYM.2018.8439837}, author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Heinrich, Wolfgang and Probst, Thorsten and Arz, Uwe} } @Conference { 3, title = {Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz}, year = {2017}, month = {12}, web_url = {https://oar.ptb.de/files/download/5ca47f714c93901374007754}, event_name = {90th ARFTG Microwave Measurement Conference (ARFTG) 2017}, DOI = {10.1109/ARFTG.2017.8255874}, author = {Arz, Uwe and Zinal, S. and Probst, Thorsten and Hechtfischer, Gerd and Schm{\"u}ckle, Franz Josef and Heinrich, Wolfgang} } @Article { , title = {An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements}, journal = {IEEE Microwave and Wireless Components Letters}, year = {2017}, month = {11}, volume = {27}, number = {11}, pages = {1034-1036}, DOI = {10.1109/LMWC.2017.2750086}, author = {Votsi, H. and Li, Chong and Aaen, P. H. and Ridler, Nick} } @Conference { , title = {110 GHz On-Wafer Measurement Comparison on Alumina Substrate}, year = {2017}, month = {11}, web_url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/arftg90_probst_repo.pdf}, event_name = {90th ARFTG Microwave Measurement Conference (ARFTG) 2017}, DOI = {10.1109/ARFTG.2017.8255867}, author = {Probst, Thorsten and Doerner, Ralf and Ohlrogge, Matthias and Lozar, Roger and Arz, Uwe} } @Conference { , title = {'Mind the Gap' ... Establishing Measurement Capability in the Terahertz Gap Region - from 0.1 THz to 1.1 THz}, year = {2017}, month = {11}, web_url = {http://eprints.whiterose.ac.uk/125335/}, event_name = {ARMMS RF \& Microwave Society Conference}, author = {Ridler, Nick and Clarke, Roland G. and Slater, M. J.} } @Conference { , title = {An Intra-laboratory Investigation of On-wafer Measurement Reproducibility at Millimeter-wave Frequencies}, year = {2017}, month = {11}, web_url = {http://eprints.whiterose.ac.uk/125336}, event_name = {90th ARFTG Microwave Measurement Conference (ARFTG) 2017}, state = {accepted}, DOI = {10.1109/arftg.2017.8255866}, author = {Clarke, Roland G. and Li, Chong and Ridler, Nick} } @Conference { , title = {IC calibration kits and de-embedding techniques for sub-mm-wave device characterization}, year = {2017}, month = {10}, event_name = {2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)}, DOI = {10.1109/csics.2017.8240449}, author = {Spirito, Marco and Galatro, Luca} } @Conference { , title = {Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization}, year = {2017}, month = {10}, event_name = {2017 47th European Microwave Conference (EuMC)}, DOI = {10.23919/EuMC.2017.8230973}, author = {Daffe, Khadim and Dambrine, Gilles and Arscott, S. and Grandidier, B. and Eliet, S. and Boyaval, C. and Xu, T. and Fellahi, A. E. and Marzouk, J. and Haddadi, Kamel} } @Conference { 0, title = {Impact of Parasitic Coupling on Multiline TRL Calibration}, year = {2017}, month = {10}, event_name = {European Microwave Conference 2017}, DOI = {10.23919/EuMC.2017.8230974}, author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Fritzsch, T. and Heinrich, Wolfgang} } @Conference { 1, title = {Mutual Interference in Calibration Line Configurations}, year = {2017}, month = {6}, web_url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2017/2018_04_24_2017_02_15_ARFTG2017_EMPIR_PTB_submitted.pdf}, event_name = {89th ARFTG Microwave Measurement Conference, 2017}, DOI = {10.1109/ARFTG.2017.8000823}, author = {Schm{\"u}ckle, Franz Josef and Probst, Thorsten and Arz, Uwe and Phung, Gia Ngoc and Doerner, Ralf and Heinrich, Wolfgang} } @Conference { , title = {VNA Tools II: Calibrations Involving Eigenvalue Problems}, year = {2017}, month = {6}, web_url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/VnaToolsLHKMEigPaper_openaccess.pdf}, event_name = {89th ARFTG Microwave Measurement Conference, 2017}, DOI = {10.1109/ARFTG.2017.8000832}, author = {Wollensack, Michael and Hoffmann, Johannes and Stalder, Daniel and Ruefenacht, Juerg and Zeier, Markus} } @Article { 4, title = {Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction}, journal = {IEEE Transactions on Microwave Theory and Techniques}, year = {2017}, month = {4}, volume = {65}, number = {4}, pages = {9}, DOI = {10.1109/TMTT.2016.2609413}, author = {Spirito, Marco and Galatro, Luca} } @Conference { , title = {Fused silica based RSOL calibration substrate for improved probelevel calibration accuracy}, year = {2016}, month = {12}, event_name = {88th ARFTG Microwave Measurement Conference, 2016}, DOI = {10.1109/ARFTG.2016.7839721}, author = {Galatro, Luca and Spirito, Marco} } @Conference { , title = {Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices}, year = {2016}, month = {12}, event_name = {88th ARFTG Microwave Measurement Conference, 2016}, DOI = {10.1109/ARFTG.2016.7839719}, author = {Li, Chong and Dambrine, Gilles and Haddadi, Kamel and Roch-Jeune, I. and Votsi, H. and Aaen, P. H. and Ridler, Nick} } @Conference { , title = {Modeling of transmission lines with multiple coated conductors}, year = {2016}, month = {10}, event_name = {46th European Microwave Conference, 2016}, DOI = {10.1109/EuMC.2016.7824423}, author = {Gold, Gerald and Helmreich, Klaus} } @Conference { 2016CPEM, title = {Comparison between time- and frequency-domain high-frequency device characterizations}, year = {2016}, month = {8}, day = {11}, event_name = {CPEM 2016, Conference on Precision Electromagnetic Measurements}, DOI = {10.1109/CPEM.2016.7540727}, author = {Bieler, Mark and Arz, Uwe} } @Conference { IEMN_ARFTG87th, title = {RF wafer probing with improved contact repeatability using nanometer positioning}, year = {2016}, month = {5}, day = {27}, event_name = {87th ARFTG Microwave Measurement Conference (ARFTG)}, DOI = {10.1109/ARFTG.2016.7501967}, author = {Daffe, Khadim and Dambrine, Gilles and von Kleist-Retzow, Fabian and Haddadi, Kamel} } @Conference { 2016SPI, title = {Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods}, year = {2016}, month = {5}, day = {9}, event_place = {Torino}, event_name = {20th IEEE Workshop on Signal and Power Integrity (SPI)}, event_date = {8-11 May 2016}, DOI = {10.1109/SaPIW.2016.7496271}, reviewed = {1}, author = {Bieler, Mark and Arz, Uwe} } @Conference { , title = {On the definition of reference planes in probe-level calibrations}, year = {2016}, month = {5}, event_name = {2016 87th ARFTG Microwave Measurement Conference (ARFTG)}, DOI = {10.1109/ARFTG.2016.7501968}, author = {Galatro, Luca and Mubarak, Faisal and Spirito, Marco} } @Conference { 2015VSL, title = {Evaluation and Modeling of Measurement Resolution of A Vector Network Analyzer for Extreme Impedance Measurements}, year = {2015}, month = {12}, day = {3}, event_name = {86th ARFTG Microwave Measurement Conference}, DOI = {10.1109/ARFTG.2015.7381475}, author = {Mubarak, Faisal and Romano, Raffaele and Spirito, Marco} }