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% sevenpack version 0.7.16
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% --- Timezone: CET
% Creation date: 2023-02-08
% Creation time: 02-06-35
% --- Number of references
% 34
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@Article { ,
   title = {A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies},
   journal = {IEEE Transactions on Microwave Theory and Techniques},
   year = {2019},
   month = {8},
   volume = {67},
   number = {8},
   pages = {3475-3484},
   DOI = {10.1109/TMTT.2019.2919538},
   author = {Lozar, Roger and Ohlrogge, Matthias and Weber, Rainer and Ridler, Nick and Shang, X. and Probst, Thorsten and Arz, Uwe}
}

@Article { 6,
   title = {Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz},
   journal = {IEEE Transactions on Microwave Theory and Techniques},
   year = {2019},
   month = {6},
   volume = {67},
   number = {6},
   pages = {2423-2432},
   web_url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=8693763},
   DOI = {10.1109/TMTT.2019.2908857},
   author = {Arz, Uwe and Kuhlmann, Karsten and Dziomba, Thorsten and Hechtfischer, Gerd and Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Heinrich, Wolfgang}
}

@Article { 8,
   title = {Influence of Microwave Probes on Calibrated On-Wafer Measurements},
   journal = {IEEE Transactions on Microwave Theory and Techniques},
   year = {2019},
   month = {5},
   volume = {67},
   number = {5},
   pages = {1892-1900},
   web_url = {https://www.fbh-berlin.de/fileadmin/downloads/Publications/2019/FINAL_VERSION_repository.pdf},
   publisher = {IEEE},
   DOI = {10.1109/TMTT.2019.2903400},
   author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and K{\"a}hne, Bernhard and Fritzsch, Thomas and Arz, Uwe and Heinrich, Wolfgang}
}

@Conference { 7,
   title = {Crosstalk Effects of Differential Thin-Film Microstrip Lines in Multilayer Motherboards},
   year = {2019},
   month = {3},
   web_url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2019/2019_02_20_GeMiC_GNP_repository.pdf},
   event_name = {12th German Microwave Conference 2019},
   DOI = {10.23919/GEMIC.2019.8698163},
   author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Fritzsch, T. and Schulz, S. and Heinrich, Wolfgang}
}

@Article { ,
   title = {Noise Behavior and Implementation of Interferometer Based Broadband VNA},
   journal = {IEEE Transactions on Microwave Theory and Techniques},
   year = {2019},
   month = {1},
   volume = {67},
   number = {1},
   pages = {249-260},
   web_url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=8566175},
   DOI = {10.1109/TMTT.2018.2874667},
   author = {Mubarak, Faisal and Romano, Raffaele and Galatro, Luca and Mascolo, V. and Rietveld, G. and Spirito, Marco}
}

@Article { 5,
   title = {High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness},
   journal = {Advances in Radio Science},
   year = {2019},
   volume = {17},
   pages = {51-57},
   web_url = {https://www.adv-radio-sci.net/17/51/2019/},
   publisher = {Copernicus Publications},
   DOI = {10.5194/ars-17-51-2019},
   author = {Gold, Gerald and Lomakin, Konstantin and Helmreich, Klaus and Arz, Uwe}
}

@Conference { ,
   title = {On-wafer residual error correction through adaptive filtering of verification line measurements},
   year = {2018},
   month = {11},
   url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/CEMi18_ArzSavin_repo.pdf},
   event_name = {2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi)},
   ISBN = {978-1-5386-7845-9},
   DOI = {10.1109/CEMI.2018.8610566},
   author = {Arz, Uwe and Savin, Aleksandr}
}

@Article { ,
   title = {On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors},
   journal = {IEEE Microwave and Wireless Components Letters},
   year = {2018},
   month = {9},
   volume = {28},
   number = {9},
   pages = {831-833},
   url = {https://hal.archives-ouvertes.fr/hal-01873048},
   DOI = {10.1109/LMWC.2018.2851386},
   author = {Daffe, Khadim and Dambrine, Gilles and Durand, C. and Gaqui{\`e}re, C. and Haddadi, Kamel}
}

@Conference { ,
   title = {Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band},
   year = {2018},
   month = {9},
   url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_06_04_EuMC_2018_Mode_Suppression_final_03.pdf},
   event_place = {Madrid},
   event_name = {2018 48th European Microwave Conference (EuMC)},
   DOI = {10.23919/EuMC.2018.8541813},
   author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Heinrich, Wolfgang and Probst, Thorsten and Arz, Uwe}
}

@Article { ,
   title = {A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model},
   journal = {IEEE Transactions on Microwave Theory and Techniques},
   year = {2018},
   month = {8},
   volume = {66},
   number = {8},
   pages = {3894-3900},
   url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=\&arnumber=8385163},
   DOI = {10.1109/TMTT.2018.2832052},
   author = {Liu, Chen and Wu, Aihua and Li, Chong and Ridler, Nick}
}

@Conference { ,
   title = {Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards},
   year = {2018},
   month = {7},
   DOI = {10.1109/CPEM.2018.8500810},
   author = {Mubarak, Faisal and Mascolo, V. and Rietveld, G. and Spirito, Marco and Daffe, Khadim and Haddadi, Kamel}
}

@Conference { ,
   title = {Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy},
   year = {2018},
   month = {7},
   url = {https://hal.archives-ouvertes.fr/hal-01913677},
   event_place = {Nagoya, Japan},
   event_name = {2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)},
   DOI = {10.1109/MARSS.2018.8481160},
   author = {Haddadi, Kamel and Polovodov, P. and Theron, D. and Dambrine, Gilles}
}

@Conference { ,
   title = {On the Impact of Radiation Losses in TRL Calibrations},
   year = {2018},
   month = {6},
   event_name = {2018 91st ARFTG Microwave Measurement Conference (ARFTG)},
   DOI = {10.1109/ARFTG.2018.8423820},
   author = {Spirito, Marco and De Martino, C. and Galatro, Luca}
}

@Conference { ,
   title = {On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz},
   journal = {91st ARFTG Conference},
   year = {2018},
   month = {6},
   web_url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/arftg91_probst_final_repo.pdf},
   DOI = {10.1109/ARFTG.2018.8423829},
   author = {Probst, Thorsten and Zinal, S. and Doerner, Ralf and Arz, Uwe}
}

@Conference { ,
   title = {Effects Degrading Accuracy of CPW mTRL Calibration at W Band},
   year = {2018},
   month = {6},
   url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2018/2018_03_07_FBH_IMS2018_final_msu.pdf},
   event_place = {Philadelphia},
   event_name = {2018 IEEE/MTT-S International Microwave Symposium - IMS},
   DOI = {10.1109/MWSYM.2018.8439837},
   author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Heinrich, Wolfgang and Probst, Thorsten and Arz, Uwe}
}

@Conference { 3,
   title = {Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz},
   year = {2017},
   month = {12},
   web_url = {https://oar.ptb.de/files/download/5ca47f714c93901374007754},
   event_name = {90th ARFTG Microwave Measurement Conference (ARFTG) 2017},
   DOI = {10.1109/ARFTG.2017.8255874},
   author = {Arz, Uwe and Zinal, S. and Probst, Thorsten and Hechtfischer, Gerd and Schm{\"u}ckle, Franz Josef and Heinrich, Wolfgang}
}

@Article { ,
   title = {An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements},
   journal = {IEEE Microwave and Wireless Components Letters},
   year = {2017},
   month = {11},
   volume = {27},
   number = {11},
   pages = {1034-1036},
   DOI = {10.1109/LMWC.2017.2750086},
   author = {Votsi, H. and Li, Chong and Aaen, P. H. and Ridler, Nick}
}

@Conference { ,
   title = {110 GHz On-Wafer Measurement Comparison on Alumina Substrate},
   year = {2017},
   month = {11},
   web_url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/arftg90_probst_repo.pdf},
   event_name = {90th ARFTG Microwave Measurement Conference (ARFTG) 2017},
   DOI = {10.1109/ARFTG.2017.8255867},
   author = {Probst, Thorsten and Doerner, Ralf and Ohlrogge, Matthias and Lozar, Roger and Arz, Uwe}
}

@Conference { ,
   title = {'Mind the Gap' ... Establishing Measurement Capability in the Terahertz Gap Region - from 0.1 THz to 1.1 THz},
   year = {2017},
   month = {11},
   web_url = {http://eprints.whiterose.ac.uk/125335/},
   event_name = {ARMMS RF \& Microwave Society Conference},
   author = {Ridler, Nick and Clarke, Roland G. and Slater, M. J.}
}

@Conference { ,
   title = {An Intra-laboratory Investigation of On-wafer Measurement Reproducibility at Millimeter-wave Frequencies},
   year = {2017},
   month = {11},
   web_url = {http://eprints.whiterose.ac.uk/125336},
   event_name = {90th ARFTG Microwave Measurement Conference (ARFTG) 2017},
   state = {accepted},
   DOI = {10.1109/arftg.2017.8255866},
   author = {Clarke, Roland G. and Li, Chong and Ridler, Nick}
}

@Conference { ,
   title = {IC calibration kits and de-embedding techniques for sub-mm-wave device characterization},
   year = {2017},
   month = {10},
   event_name = {2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)},
   DOI = {10.1109/csics.2017.8240449},
   author = {Spirito, Marco and Galatro, Luca}
}

@Conference { ,
   title = {Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization},
   year = {2017},
   month = {10},
   event_name = {2017 47th European Microwave Conference (EuMC)},
   DOI = {10.23919/EuMC.2017.8230973},
   author = {Daffe, Khadim and Dambrine, Gilles and Arscott, S. and Grandidier, B. and Eliet, S. and Boyaval, C. and Xu, T. and Fellahi, A. E. and Marzouk, J. and Haddadi, Kamel}
}

@Conference { 0,
   title = {Impact of Parasitic Coupling on Multiline TRL Calibration},
   year = {2017},
   month = {10},
   event_name = {European Microwave Conference 2017},
   DOI = {10.23919/EuMC.2017.8230974},
   author = {Phung, Gia Ngoc and Schm{\"u}ckle, Franz Josef and Doerner, Ralf and Fritzsch, T. and Heinrich, Wolfgang}
}

@Conference { 1,
   title = {Mutual Interference in Calibration Line Configurations},
   year = {2017},
   month = {6},
   web_url = {https://www.fbh-berlin.com/fileadmin/downloads/Publications/2017/2018_04_24_2017_02_15_ARFTG2017_EMPIR_PTB_submitted.pdf},
   event_name = {89th ARFTG Microwave Measurement Conference, 2017},
   DOI = {10.1109/ARFTG.2017.8000823},
   author = {Schm{\"u}ckle, Franz Josef and Probst, Thorsten and Arz, Uwe and Phung, Gia Ngoc and Doerner, Ralf and Heinrich, Wolfgang}
}

@Conference { ,
   title = {VNA Tools II: Calibrations Involving Eigenvalue Problems},
   year = {2017},
   month = {6},
   web_url = {https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open\%20Access/VnaToolsLHKMEigPaper_openaccess.pdf},
   event_name = {89th ARFTG Microwave Measurement Conference, 2017},
   DOI = {10.1109/ARFTG.2017.8000832},
   author = {Wollensack, Michael and Hoffmann, Johannes and Stalder, Daniel and Ruefenacht, Juerg and Zeier, Markus}
}

@Article { 4,
   title = {Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction},
   journal = {IEEE Transactions on Microwave Theory and Techniques},
   year = {2017},
   month = {4},
   volume = {65},
   number = {4},
   pages = {9},
   DOI = {10.1109/TMTT.2016.2609413},
   author = {Spirito, Marco and Galatro, Luca}
}

@Conference { ,
   title = {Fused silica based RSOL calibration substrate for improved probelevel calibration accuracy},
   year = {2016},
   month = {12},
   event_name = {88th ARFTG Microwave Measurement Conference, 2016},
   DOI = {10.1109/ARFTG.2016.7839721},
   author = {Galatro, Luca and Spirito, Marco}
}

@Conference { ,
   title = {Development of a Reference Wafer for On-wafer Testing of Extreme Impedance Devices},
   year = {2016},
   month = {12},
   event_name = {88th ARFTG Microwave Measurement Conference, 2016},
   DOI = {10.1109/ARFTG.2016.7839719},
   author = {Li, Chong and Dambrine, Gilles and Haddadi, Kamel and Roch-Jeune, I. and Votsi, H. and Aaen, P. H. and Ridler, Nick}
}

@Conference { ,
   title = {Modeling of transmission lines with multiple coated conductors},
   year = {2016},
   month = {10},
   event_name = {46th European Microwave Conference, 2016},
   DOI = {10.1109/EuMC.2016.7824423},
   author = {Gold, Gerald and Helmreich, Klaus}
}

@Conference { 2016CPEM,
   title = {Comparison between time- and frequency-domain high-frequency device characterizations},
   year = {2016},
   month = {8},
   day = {11},
   event_name = {CPEM 2016, Conference on Precision Electromagnetic Measurements},
   DOI = {10.1109/CPEM.2016.7540727},
   author = {Bieler, Mark and Arz, Uwe}
}

@Conference { IEMN_ARFTG87th,
   title = {RF wafer probing with improved contact repeatability using nanometer positioning},
   year = {2016},
   month = {5},
   day = {27},
   event_name = {87th ARFTG Microwave Measurement Conference (ARFTG)},
   DOI = {10.1109/ARFTG.2016.7501967},
   author = {Daffe, Khadim and Dambrine, Gilles and von Kleist-Retzow, Fabian and Haddadi, Kamel}
}

@Conference { 2016SPI,
   title = {Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods},
   year = {2016},
   month = {5},
   day = {9},
   event_place = {Torino},
   event_name = {20th IEEE Workshop on Signal and Power Integrity (SPI)},
   event_date = {8-11 May 2016},
   DOI = {10.1109/SaPIW.2016.7496271},
   reviewed = {1},
   author = {Bieler, Mark and Arz, Uwe}
}

@Conference { ,
   title = {On the definition of reference planes in probe-level calibrations},
   year = {2016},
   month = {5},
   event_name = {2016 87th ARFTG Microwave Measurement Conference (ARFTG)},
   DOI = {10.1109/ARFTG.2016.7501968},
   author = {Galatro, Luca and Mubarak, Faisal and Spirito, Marco}
}

@Conference { 2015VSL,
   title = {Evaluation and Modeling of Measurement Resolution of A Vector Network Analyzer for Extreme Impedance Measurements},
   year = {2015},
   month = {12},
   day = {3},
   event_name = {86th ARFTG Microwave Measurement Conference},
   DOI = {10.1109/ARFTG.2015.7381475},
   author = {Mubarak, Faisal and Romano, Raffaele and Spirito, Marco}
}