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Title:

On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz

Author(s): Thorsten Probst, S. Zinal, Ralf Doerner and Uwe Arz
Journal: 91st ARFTG Conference
Year: 2018
Month: June
DOI: 10.1109/ARFTG.2018.8423829
Web URL: https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/arftg91_probst_final_repo.pdf

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