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Title:

Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods

Author(s): Mark Bieler and Uwe Arz
Year: 2016
Month: May
Day: 9
Conference name: 20th IEEE Workshop on Signal and Power Integrity (SPI)
Conference place: Torino
Conference date: 8-11 May 2016
DOI: 10.1109/SaPIW.2016.7496271

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