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A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

Author(s): Chen Liu, Aihua Wu, Chong Li and Nick Ridler
Journal: IEEE Transactions on Microwave Theory and Techniques
Year: 2018
Month: August
Volume: 66
Issue: 8
Pages: 3894-3900
DOI: 10.1109/TMTT.2018.2832052
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