Title: |
A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model |
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Author(s): | , , and |
Journal: | IEEE Transactions on Microwave Theory and Techniques |
Year: | 2018 |
Month: | August |
Volume: | 66 |
Issue: | 8 |
Pages: | 3894-3900 |
DOI: | 10.1109/TMTT.2018.2832052 |
File URL: | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8385163 |