Title: |
Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction |
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| Author(s): | and |
| Journal: | IEEE Transactions on Microwave Theory and Techniques |
| Year: | 2017 |
| Month: | April |
| Volume: | 65 |
| Issue: | 4 |
| Pages: | 9 |
| DOI: | 10.1109/TMTT.2016.2609413 |