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Title:

VNA Tools II: Calibrations Involving Eigenvalue Problems

Author(s): Michael Wollensack, Johannes Hoffmann, Daniel Stalder, Juerg Ruefenacht and Markus Zeier
Year: 2017
Month: June
Conference name: 89th ARFTG Microwave Measurement Conference, 2017
DOI: 10.1109/ARFTG.2017.8000832
Web URL: https://www.planarcal.ptb.de/fileadmin/documents/empir/14Ind02/documents/Open%20Access/VnaToolsLHKMEigPaper_openaccess.pdf

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