Publication single view


Establishing Traceability for On-Wafer S-Parameter Measurements of Membrane Technology Devices up to 110 GHz

Author(s): Uwe Arz, S. Zinal, Thorsten Probst, Gerd Hechtfischer, Franz Josef Schmückle and Wolfgang Heinrich
Year: 2017
Month: December
Conference name: 90th ARFTG Microwave Measurement Conference (ARFTG) 2017
DOI: 10.7795/EMPIR.14IND02.CA.20190403
Web URL:

Back to the list view