Title: |
On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors |
|---|---|
| Author(s): | , , , and |
| Journal: | IEEE Microwave and Wireless Components Letters |
| Year: | 2018 |
| Month: | September |
| Volume: | 28 |
| Issue: | 9 |
| Pages: | 831-833 |
| DOI: | 10.1109/LMWC.2018.2851386 |
| File URL: | https://hal.archives-ouvertes.fr/hal-01873048 |