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On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors

Author(s): Khadim Daffe, Gilles Dambrine, C. Durand, C. Gaquière and Kamel Haddadi
Journal: IEEE Microwave and Wireless Components Letters
Year: 2018
Month: September
Volume: 28
Issue: 9
Pages: 831-833
DOI: 10.1109/LMWC.2018.2851386
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