Title: |
An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements |
|---|---|
| Author(s): | , , and |
| Journal: | IEEE Microwave and Wireless Components Letters |
| Year: | 2017 |
| Month: | November |
| Volume: | 27 |
| Issue: | 11 |
| Pages: | 1034-1036 |
| DOI: | 10.1109/LMWC.2017.2750086 |